Trace element measurements using white synchrotron radiation

Osteocytes Characterization Using Synchrotron Radiation CT and Finite Element Analysis

Looking at trace impurities on silicon wafers with synchrotron radiation.

Figure 1. TXRF spectrum of a clean Si wafer surface showing 6.4x10 atoms/cm Fe and 2.6x10 atoms/cm Cu. The Cl is a residue from the HCl solution used to clean the wafer surface and the Ag is a artifact from the particular collimator used in these studies. Other features seen in the spectrum are the Si substrate peak, the scatter peak at 11.2 keV and the escape peak at 9.4 keV. Looking at Trace ...

Materials Analysis Using Synchrotron Radiation

Synchrotron radiation (SR) is a tunable, highly oriented, intense X-ray. Its tunability has led to XAFS being used as a common analytical tool, and is particularly useful for examining local structures. In fact, its use is indispensable to the examination of not only amorphous materials or solutions but also multicomponent systems. Thanks to the high intensity of SR, it is possible to determine...

Protein microcrystallography using synchrotron radiation

The progress in X-ray microbeam applications using synchrotron radiation is beneficial to structure determination from macromolecular microcrystals such as small in meso crystals. However, the high intensity of microbeams causes severe radiation damage, which worsens both the statistical quality of diffraction data and their resolution, and in the worst cases results in the failure of structure...

Serial crystallography using synchrotron radiation

A brief history is given of how X-ray diffraction data from crystals have been recorded. Today there are new possibilities, spawned by the availability of free electron lasers that produce powerful femtosecond long X-ray pulses.